Three-beam x-ray diffraction in crystals with thin strain layers

M. D. Borcha; O. S. Kshevetsky; V. M. Tkach

doi:10.1117/12.559870

4 June 2004 Three-beam x-ray diffraction in crystals with thin strain layers

M. D. Borcha, O. S. Kshevetsky, V. M. Tkach

Proceedings Volume 5477, Sixth International Conference on Correlation Optics; (2004) https://doi.org/10.1117/12.559870
Event: Sixth International Conference on Correlation Optics, 2003, Chernivsti, Ukraine

Abstract

By a numerical solution of the system of Takagi differential equations, the influence of a thin subsurface strained layer and a system of equal strained layers on three-beam diffraction effects of X-ray scattering in A³B⁵ compounds and diamond crystals have been investigated. It is established that the degree of suppression or enhancement of three-beam anomalous transmission significantly depends on the influence of the parameters of the strained layer on various effects typical for each multiple configuration, as well as on the structural features of the crystals being considered.

Citation Download Citation

M. D. Borcha, O. S. Kshevetsky, and V. M. Tkach "Three-beam x-ray diffraction in crystals with thin strain layers", Proc. SPIE 5477, Sixth International Conference on Correlation Optics, (4 June 2004); https://doi.org/10.1117/12.559870

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