Translator Disclaimer
Paper
20 October 2004 Metrology system for Space Interferometry Mission's system testbed 3
Author Affiliations +
Abstract
The Space Interferometry mission's nano-meter class System Testbed has implemented an external metrology system to monitor changes in the length & orientation of the science interferometer baseline vector, which cannot be monitored directly. The output of the system is used in real time fringe tracking of dim stars. This paper describes the external metrology system, its mathematical representation, limitations, and method for estimating the length & orientation of the science baseline vector. Simulations and current system performance are presented and discussed.
© (2004) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Oscar S. Alvarez-Salazar, Alireza Azizi, Yekta Gursel, George Sun, Jens Fischer, Arshak Avanesyan, and John Shaw "Metrology system for Space Interferometry Mission's system testbed 3", Proc. SPIE 5491, New Frontiers in Stellar Interferometry, (20 October 2004); https://doi.org/10.1117/12.549694
PROCEEDINGS
12 PAGES


SHARE
Advertisement
Advertisement
RELATED CONTENT

Description of the USNO astrometric interferometer
Proceedings of SPIE (August 01 1990)
Overview of SIM external calibration
Proceedings of SPIE (February 26 2003)
SIM astrometric grid
Proceedings of SPIE (February 26 2003)
SIM system testbed 3 baseline stellar interferometer on a...
Proceedings of SPIE (October 20 2004)

Back to Top