Incoming metrology of segmented x-ray mandrels at MSFC

Mikhail V. Gubarev; Steve L. O'Dell; Thomas J. Kester; David L. Lehner; William D. Jones; Martin E. Smithers; David A. Content; Paul B. Reid

doi:10.1117/12.551902

24 September 2004 Incoming metrology of segmented x-ray mandrels at MSFC

Mikhail V. Gubarev, Steve L. O'Dell, Thomas J. Kester, David L. Lehner, William D. Jones, Martin E. Smithers, David A. Content, Paul B. Reid

Author Affiliations +

Proceedings Volume 5494, Optical Fabrication, Metrology, and Material Advancements for Telescopes; (2004) https://doi.org/10.1117/12.551902
Event: SPIE Astronomical Telescopes + Instrumentation, 2004, Glasgow, United Kingdom

Abstract

The baseline design of the Constellation-X Spectroscopy X-ray telescope (SXT) employs segmented x-ray mirrors, to be replicated from precision mandrels. Thus far, the Constellation-X Project has procured and received three (3) flight-scale mandrels, for use in development of mirror technologies. Complementary to 30° sections of 10-m-focal-length Wolter-1 optics of diameters 1.6, 1.2, and 1.0 m, the mandrels’ primary (parabolic) and secondary (hyperbolic) optical surfaces are each 0.5-m long. In order to generate surface maps for x-ray performance predictions, NASA’s Marshall Space Flight Center (MSFC) is conducting incoming metrology. Using a combination of instruments, this metrology measures axial-slope deviations and axial profiles, slope differences, roundness, absolute radius, and micro-roughness. This paper describes the mandrels, the metrology requirements, and MSFC’s metrology instrumentation and procedures.

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Mikhail V. Gubarev, Steve L. O'Dell, Thomas J. Kester, David L. Lehner, William D. Jones, Martin E. Smithers, David A. Content, and Paul B. Reid "Incoming metrology of segmented x-ray mandrels at MSFC", Proc. SPIE 5494, Optical Fabrication, Metrology, and Material Advancements for Telescopes, (24 September 2004); https://doi.org/10.1117/12.551902

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