Application of OCT to examination of easel paintings

Haida Liang; Rada Cucu; George M. Dobre; David A. Jackson; Justin Pedro; Christopher Pannell; David Saunders; Adrian Gh. Podoleanu

doi:10.1117/12.566780

9 June 2004 Application of OCT to examination of easel paintings

Haida Liang, Rada Cucu, George M. Dobre, David A. Jackson, Justin Pedro, Christopher Pannell, David Saunders, Adrian Gh. Podoleanu

Author Affiliations +

Proceedings Volume 5502, Second European Workshop on Optical Fibre Sensors; (2004) https://doi.org/10.1117/12.566780
Event: Second European Workshop on Optical Fibre Sensors, 2004, Santander, Spain

Abstract

We present results of applying low coherence interferometry to gallery paintings. Infrared low coherence interferometry is capable of non-destructive examination of paintings in 3D, which shows not only the structure of the varnish layer but also the paint layers.

Citation Download Citation

Haida Liang, Rada Cucu, George M. Dobre, David A. Jackson, Justin Pedro, Christopher Pannell, David Saunders, and Adrian Gh. Podoleanu "Application of OCT to examination of easel paintings", Proc. SPIE 5502, Second European Workshop on Optical Fibre Sensors, (9 June 2004); https://doi.org/10.1117/12.566780

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