Design of an elliptical crystal spectrometer for diagnosing pulsed plasma x-ray

Xianxin Zhong; Xiancai Xiong; Shali Xiao; Yu Chen; Jiayu Qian; Jie Gao

doi:10.1117/12.557423

22 October 2004 Design of an elliptical crystal spectrometer for diagnosing pulsed plasma x-ray

Xianxin Zhong, Xiancai Xiong, Shali Xiao, Yu Chen, Jiayu Qian, Jie Gao

Proceedings Volume 5524, Novel Optical Systems Design and Optimization VII; (2004) https://doi.org/10.1117/12.557423
Event: Optical Science and Technology, the SPIE 49th Annual Meeting, 2004, Denver, Colorado, United States

Abstract

A novel elliptical crystal spectrometer has been designed and manufactured to diagnose pulsed plasmas x-ray. The light path is designed according to the elliptical focusing property. The spectrometer is composed of the elliptical x-ray analyzer, the alignment devices, the vacuum system, the ports of the spectral detectors for x-ray CCD camera and x-ray streak camara, the supporting base, and the adapting flange to the target chamber. The target-shooting experiment was performed at the XG-Π and SGΠlaser facilities for testing the spectrometer. The optical system, optoelectronic machinery system, experimental results are discussed in this paper.

Citation Download Citation

Xianxin Zhong, Xiancai Xiong, Shali Xiao, Yu Chen, Jiayu Qian, and Jie Gao "Design of an elliptical crystal spectrometer for diagnosing pulsed plasma x-ray", Proc. SPIE 5524, Novel Optical Systems Design and Optimization VII, (22 October 2004); https://doi.org/10.1117/12.557423

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