Statistical property of the complex analytic signal of white-light speckle pattern applied to microdisplacement measurement

Wei Wang; Nobuo Ishii; Yoko Miyamoto; Mitsuo Takeda

doi:10.1117/12.559118

2 August 2004 Statistical property of the complex analytic signal of white-light speckle pattern applied to microdisplacement measurement

Wei Wang, Nobuo Ishii, Yoko Miyamoto, Mitsuo Takeda

Author Affiliations +

Proceedings Volume 5531, Interferometry XII: Techniques and Analysis; (2004) https://doi.org/10.1117/12.559118
Event: Optical Science and Technology, the SPIE 49th Annual Meeting, 2004, Denver, Colorado, United States

Abstract

Under the assumption of Gaussian random process, we discuss the first and the second order statistical properties of the complex amplitude of analytic signal of the white-light speckle pattern. We derive the autocorrelation function of the pseudo phase. Based on these results, we show mathematically that the proposed signal domain phase-only correlation (SD-POC) has advantage over the conventional intensity-based correlation techniques in its performance of micro-displacement measurement. We also present experimental results that support the theory.

Citation Download Citation

Wei Wang, Nobuo Ishii, Yoko Miyamoto, and Mitsuo Takeda "Statistical property of the complex analytic signal of white-light speckle pattern applied to microdisplacement measurement", Proc. SPIE 5531, Interferometry XII: Techniques and Analysis, (2 August 2004); https://doi.org/10.1117/12.559118

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