Paper
26 October 2004 High-throughput x-ray microtomography system at the Advanced Photon Source beamline 2-BM
Francesco De Carlo, Brian Tieman
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Abstract
X-ray microtomography is rapidly becoming the tool of choice for three-dimensional (3D) imaging of thick structures at the 1-10 µm scale. The fast microtomography system developed at beamline 2-BM of the Advanced Photon Source (APS) is a new class of instrument offering near video-rate acquisition of tomographic data combined with pipelined processing, reconstruction, and visualization. This system can acquire and reconstruct 720 projections (1024x1024 pixels) at 0.25 deg angular increments in under 5 min using a dedicated 32-node computer cluster. At this throughput, hundreds of specimens can be imaged in a 24 h experiment. Alternatively, time-dependent 3D sample evolution can be studied on practical time scales. In this work, we present the current instrument status and the most recent application.
© (2004) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Francesco De Carlo and Brian Tieman "High-throughput x-ray microtomography system at the Advanced Photon Source beamline 2-BM", Proc. SPIE 5535, Developments in X-Ray Tomography IV, (26 October 2004); https://doi.org/10.1117/12.559223
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Cited by 24 scholarly publications.
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KEYWORDS
X-rays

Tomography

Teeth

3D acquisition

Data acquisition

Scintillators

Computing systems

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