Paper
15 October 2004 Calibration procedures and measurement results of a fast semihemispherical spectroradiometer in VIS and NIR
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Abstract
A small, fast and rugged spectro-radiometer without moving parts for angular resolution for the fast acquisition of large amounts of BRDF data over wavelength to be compiled into libraries is being developed. The system consists of an elliptical mirror which maps a semi-hemisphere onto a CMOS-detector with a dynamic range of 140dB. Radiometric measurements over a wide spectral range from VIS to NIR over 7 deacades (10-5 W/m2 to 100 W/m2) require a pixelwise calibration taking into account the spectral characteristics of the light sources, potentially used filters and the CMOS-detector itself. Also the elliptical mirror has a reflectivity which is a function of the incident angle, the wavelength and polarization of the collected light. All these influences have to be taken into account, if a proper radiometric measurement shall be conducted. The paper deals with the instrument design and mainly with its calibration, and gives some measurement results.
© (2004) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Cornelius Hahlweg and Hendrik Rothe "Calibration procedures and measurement results of a fast semihemispherical spectroradiometer in VIS and NIR", Proc. SPIE 5546, Imaging Spectrometry X, (15 October 2004); https://doi.org/10.1117/12.555902
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KEYWORDS
Sensors

Calibration

Bidirectional reflectance transmission function

Mirrors

Reflectivity

Light emitting diodes

Light sources

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