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29 December 2004 Terahertz near-field microscopy
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Proceedings Volume 5593, Nanosensing: Materials and Devices; (2004) https://doi.org/10.1117/12.571300
Event: Optics East, 2004, Philadelphia, Pennsylvania, United States
Abstract
We report on the development of an apertureless scanning near-field optical microscope for characterization of dielectric properties of nano-structures at terahertz frequencies. A spatial resolution of ≈ 150 nm is achieved, which corresponds to a sub-wavelength factor of ≈1/1000. The imaging mechanism is due to a resonant coupling between light field and the tip-surface system. This allows for image contrasts which exceed those can be expected from Mie scattering by orders of magnitude. Terahertz images of organic and inorganic structures show that the apertureless terahertz microscopy gives insight into the dielectric properties on submicron scale.
© (2004) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Hou-Tong Chen, Gyu Cheon Cho, and Roland Kersting "Terahertz near-field microscopy", Proc. SPIE 5593, Nanosensing: Materials and Devices, (29 December 2004); https://doi.org/10.1117/12.571300
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