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21 October 2004 Characterization of a reflective spatial light modulator by determination of its Jones matrix
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Proceedings Volume 5622, 5th Iberoamerican Meeting on Optics and 8th Latin American Meeting on Optics, Lasers, and Their Applications; (2004) https://doi.org/10.1117/12.591964
Event: 5th Iberoamerican Meeting on Optics and 8th Latin American Meeting on Optics, Lasers, and Their Applications, 2004, Porlamar, Venezuela
Abstract
We propose a novel spatial light modulator (SLM) characterization method based on ellipsometric techniques, in which the Jones matrix describing the SLM polarization capabilities can be obtained and then used for any arbitrary configuration of the device. We have used it to characterize a reflecting SLM (analogue ferroelectric liquid crystal from Boulder Nonlinear Systems).
© (2004) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
J. Andilla, Estela Martin-Badosa, and Santiago Vallmitjana "Characterization of a reflective spatial light modulator by determination of its Jones matrix", Proc. SPIE 5622, 5th Iberoamerican Meeting on Optics and 8th Latin American Meeting on Optics, Lasers, and Their Applications, (21 October 2004); https://doi.org/10.1117/12.591964
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