Paper
21 October 2004 Phase shifting interferometry by using an LCD and bironchi test
Author Affiliations +
Proceedings Volume 5622, 5th Iberoamerican Meeting on Optics and 8th Latin American Meeting on Optics, Lasers, and Their Applications; (2004) https://doi.org/10.1117/12.591802
Event: 5th Iberoamerican Meeting on Optics and 8th Latin American Meeting on Optics, Lasers, and Their Applications, 2004, Porlamar, Venezuela
Abstract
Nowadays there are a lot of optical interferometric tests, but there is no doubt the most used, among the lateral shear interferometry is the Ronchi test. In this work we implement the Bi-Ronchi test by generating a square Ronchi ruling onto a LCD. Phase shifting interferometry and a matrix method were used to recover the wavefront aberration. Plots of the surface under test and wavefront abberations are also shown.
© (2004) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Jorge Castro-Ramos, Sergio Vazquez-Montiel, and Alfonso Padilla-Vivanco "Phase shifting interferometry by using an LCD and bironchi test", Proc. SPIE 5622, 5th Iberoamerican Meeting on Optics and 8th Latin American Meeting on Optics, Lasers, and Their Applications, (21 October 2004); https://doi.org/10.1117/12.591802
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KEYWORDS
Ronchi rulings

Wavefronts

Wavefront aberrations

LCDs

Mirrors

Phase interferometry

Interferometry

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