Paper
26 January 2005 Investigation of spatial beam profiles of a femtosecond Ti:sapphire laser amplifier
Tao Liu, You-bo Zhao, Tie-qun Zhang, Ming-wei Wang, Xiao-nong Zhu
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Abstract
With a homemade laser beam profile measurement system, the characteristics of the spatial beam profile of 40 GW amplified femtosecond laser pulses have been studied. It is found that the laser beam profile has better quality at lower pump current, and the beam quality decreases as the pump current increases. In particular, the light intensity at the central area of the femtosecond laser beam may actually become weaker at high current than that at the low current. It is also found that within the multipass amplification process the beam quality of the pump laser has a great impact on the spatial beam profile of the femtosecond laser pulses.
© (2005) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Tao Liu, You-bo Zhao, Tie-qun Zhang, Ming-wei Wang, and Xiao-nong Zhu "Investigation of spatial beam profiles of a femtosecond Ti:sapphire laser amplifier", Proc. SPIE 5627, High-Power Lasers and Applications III, (26 January 2005); https://doi.org/10.1117/12.575660
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KEYWORDS
Femtosecond phenomena

Amplifiers

Optical amplifiers

Optical testing

CCD image sensors

Pulsed laser operation

Charge-coupled devices

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