A measuring technology for fiber connector end surface

Yanjun Fu; Wendong Zou; Huirong Xiao; Yuehong Gan

doi:10.1117/12.581452

20 January 2005 A measuring technology for fiber connector end surface

Yanjun Fu, Wendong Zou, Huirong Xiao, Yuehong Gan

Proceedings Volume 5633, Advanced Materials and Devices for Sensing and Imaging II; (2005) https://doi.org/10.1117/12.581452
Event: Photonics Asia, 2004, Beijing, China

Abstract

A non-contact optical microscopy system is described. It adopts basic Michelson structure to measure the characteristic of end surface of the fiber connector. We take use of the Fourier transform to process interference pattern. Getting the high information of two-dimension section picture. We take use of the First Derivative is extremum and Second Derivative is zero to detect the edge jump points. And we take use of Least Square Method etc. curve fitting method to describe the two-dimension section picture. We analyze the method to measure geometrical parameters of end surface. Then we can measure the characteristic of end surface. For example: the geometric parameters and roughness.

Citation Download Citation

Yanjun Fu, Wendong Zou, Huirong Xiao, and Yuehong Gan "A measuring technology for fiber connector end surface", Proc. SPIE 5633, Advanced Materials and Devices for Sensing and Imaging II, (20 January 2005); https://doi.org/10.1117/12.581452

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