Paper
8 February 2005 Information entropy method for measuring the axial displacement of a bead and its application to analyzing the trapping force of optical trap
Jian Hua Bao, Yin Mei Li, Li Ren Lou, Zan Gong, Zhuo Wang, H. W. Wang
Author Affiliations +
Abstract
It is often necessary to follow the axial movement of a micron particle, such as the one trapped in optical trap, in addition to its radial movement. A new method based on the information entropy is developed for measuring the axial displacement, which is then used to reconsider the drag force method for measuring the radial trapping force and stiffness in an optical tweezers system. It is found that the new equilibrium position of the bead displaces not only radially but also axially when the surrounding viscous fluid flows at constant lateral velocity. The result implies that the trap stiffness measured in such a way is not really for the same horizontal plane. In addition, the measured trajectory of the bead (both radial and axial displacements) shows that the sphere escapes from the optical trap upward in stead of radially when the fluid velocity reaches the critical value. The fact indicates that the escape force is not the maximal radial trapping force as commonly accepted. It also deduced that the axial movement of the bead is one of error sources for trapping force calibration using the drag-force method.
© (2005) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Jian Hua Bao, Yin Mei Li, Li Ren Lou, Zan Gong, Zhuo Wang, and H. W. Wang "Information entropy method for measuring the axial displacement of a bead and its application to analyzing the trapping force of optical trap", Proc. SPIE 5637, Electronic Imaging and Multimedia Technology IV, (8 February 2005); https://doi.org/10.1117/12.570866
Lens.org Logo
CITATIONS
Cited by 1 scholarly publication.
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Optical spheres

Optical tweezers

Calibration

Image information entropy

Particles

Scattering

Ferroelectric materials

Back to Top