Paper
10 February 2005 Self-focusing x-ray spectrometer using mica as the dispersive element
Xiancai Xiong, Xianxin Zhong, Shali Xiao, Zhongwei Hu, Jiayu Qian
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Abstract
A new crystal spectrometer has been designed and fabricated for measuring laser-plasma x-ray in the 0.99-1.83-nm region. The cleaved mica crystal with 0.2-mm thickness was curved and glued on an elliptical substrate as the dispersive element. The x-ray source and exit slit are respectively placed at the first and second focal point of the elliptical crystal. The x-ray is diffracted by the mica crystal and focused at the exit slit. An x-ray sensitive charge coupled device or streak camera can be easily amounted in the perpendicular orientation to record the space and time resolved x-ray spectra. The spectrometer was tested at the XG-2 laser facility, and the experimental result shows that the maximum spectral resolution is 999.
© (2005) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Xiancai Xiong, Xianxin Zhong, Shali Xiao, Zhongwei Hu, and Jiayu Qian "Self-focusing x-ray spectrometer using mica as the dispersive element", Proc. SPIE 5638, Optical Design and Testing II, (10 February 2005); https://doi.org/10.1117/12.567896
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KEYWORDS
X-rays

Crystals

Spectroscopy

Mica

Plasmas

X-ray diffraction

CCD cameras

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