Image estimation for structured-illumination microscopy

Jose-Angel Conchello

doi:10.1117/12.602633

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24 March 2005 Image estimation for structured-illumination microscopy

Jose-Angel Conchello

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Proceedings Volume 5701, Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XII; (2005) https://doi.org/10.1117/12.602633
Event: SPIE BiOS, 2005, San Jose, CA, United States

Abstract

When recording three-dimensional (3D) images by the method of optical sectioning microscopy, each optical section contains the in-focus information plus out-of-focus contributions that obscure the in-focus detail and reduce contrast. There are several methods to remove or prevent the out-of-focus contributions from the stack of optical sections. One such method is image estimation -the use of a computer program based on a mathematical description of the microscope to remove the out-of-focus contributions. Another method is the use of structured illumination and a simple arithmetic operation to obtain a image that in which the out-of-focus contributions are greatly reduced. We derived a method for image estimation that uses the images collected from the structured-illumination microscope. The method improves the resolution of small detail over that possible with the structured illumination using the simple arithmetic formula.

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Jose-Angel Conchello "Image estimation for structured-illumination microscopy", Proc. SPIE 5701, Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XII, (24 March 2005); https://doi.org/10.1117/12.602633

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