Scanning microscopy with extended depth of focus

Rimas Juskaitis; Edward J Botcherby; Tony Wilson

doi:10.1117/12.585195

24 March 2005 Scanning microscopy with extended depth of focus

Rimas Juskaitis, Edward J Botcherby, Tony Wilson

Proceedings Volume 5701, Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XII; (2005) https://doi.org/10.1117/12.585195
Event: SPIE BiOS, 2005, San Jose, CA, United States

Abstract

We demonstrate a simple and light-efficient way of generating non-diffracting Bessel beams for use in confocal microscopy. A number of imaging modalities using such beams is discussed. Preliminary experimental results including brightfield, fluorescence and two-photon images are presented.

Citation Download Citation

Rimas Juskaitis, Edward J Botcherby, and Tony Wilson "Scanning microscopy with extended depth of focus", Proc. SPIE 5701, Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XII, (24 March 2005); https://doi.org/10.1117/12.585195

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available