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24 March 2005 Scanning microscopy with extended depth of focus
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Abstract
We demonstrate a simple and light-efficient way of generating non-diffracting Bessel beams for use in confocal microscopy. A number of imaging modalities using such beams is discussed. Preliminary experimental results including brightfield, fluorescence and two-photon images are presented.
© (2005) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Rimas Juskaitis, Edward J Botcherby, and Tony Wilson "Scanning microscopy with extended depth of focus", Proc. SPIE 5701, Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XII, (24 March 2005); https://doi.org/10.1117/12.585195
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