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21 March 2005 Ultra-high resolution optical coherence tomography for material characterization and quality control
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Optical coherence tomography (OCT), so far mainly used in the biomedical field, has a high potential as non-destructive and contactless technique for material characterization and analysis. For these applications, OCT systems with ultra-high resolution in the micrometer range and capable of high imaging speeds are required. In this work, we combine ultra-high resolution imaging using a femtosecond Ti:sapphire laser as light source with the concepts of transversal OCT. Based on acquisition by heterodyne detection via acousto-optic modulators (AOMs), and by using an xy-galvano scanner unit we are able to obtain en-face scans with sizes as large as 3 x 3 mm2 within a few seconds. The ultra-high resolution of our OCT system of 2.95 μm axially and 4 μm laterally, both in air, is shown to be essential for imaging of different compounds and fibre materials. We demonstrate the benefits of en-face scanning OCT for various applications in material investigation where in-plane information is of interest which can hardly be obtained by cross-sectional OCT.
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Karin Wiesauer, Michael Pircher, Erich Goetzinger, Rainer Engelke, Gisela Ahrens, Gabi Gruetzner, Christoph K. Hitzenberger, and David Stifter "Ultra-high resolution optical coherence tomography for material characterization and quality control", Proc. SPIE 5714, Commercial and Biomedical Applications of Ultrafast Lasers V, (21 March 2005);

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