3D chemical mapping using terahertz pulsed imaging

Yao-Chun Shen; Philip F. Taday; David A. Newnham; Michael C. Kemp; Michael Pepper

doi:10.1117/12.591472

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25 March 2005 3D chemical mapping using terahertz pulsed imaging

Yao-Chun Shen, Philip F. Taday, David A. Newnham, Michael C. Kemp, Michael Pepper

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Proceedings Volume 5727, Terahertz and Gigahertz Electronics and Photonics IV; (2005) https://doi.org/10.1117/12.591472
Event: Integrated Optoelectronic Devices 2005, 2005, San Jose, California, United States

Abstract

We report the use of a terahertz pulsed imaging technique for three-dimensional chemical mapping. Terahertz radiation reflected from a sample was measured pixel-by-pixel in time domain using a terahertz pulsed imaging system developed at TeraView Ltd, UK. The recorded terahertz waveforms were then transformed into frequency domain using time-partitioned Fourier transform. Structural maps of samples were obtained by analyzing the terahertz time-domain data whilst chemical maps were obtained from terahertz spectral data sets. For a sample comprising chemical A at the surface of a polyethylene pellet and chemical B buried inside the pellet, we have separated the component spatial patterns of the two chemicals using their spectral fingerprints. The reconstructed three-dimensional chemical maps not only locate the chemicals in the object, but also identify each chemical. We also demonstrate the capabilities of terahertz pulsed imaging for non-destructive analysis of coating thickness and quality, and for detecting and identifying explosive materials such as RDX.

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Yao-Chun Shen, Philip F. Taday, David A. Newnham, Michael C. Kemp, and Michael Pepper "3D chemical mapping using terahertz pulsed imaging", Proc. SPIE 5727, Terahertz and Gigahertz Electronics and Photonics IV, (25 March 2005); https://doi.org/10.1117/12.591472

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