Paper
9 June 2005 Features of recording and calculating XEOL spectra
Vyacheslav I. Kochubey, Julia G. Konyukhova, Ol'ga V. Chugunova
Author Affiliations +
Abstract
Fluorescence techniques of recording EXAFS spectra are considered: XEOL and fluorescence EXAFS. The main causes of spectra distortions induced by both experiment conditions and mechanisms of luminescence's appearance under the action of synchrotron radiation. The algorithms of correction of experimental spectra to compensate for distortions are considered. By the example of alkali-halide crystals, it is demonstrated that, as the spectrum is recorded, radiationinduced transformations of the structure can occur in the sample. These transformations are not brought out in EXAFS spectra, but are detected by the XEOL method.
© (2005) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Vyacheslav I. Kochubey, Julia G. Konyukhova, and Ol'ga V. Chugunova "Features of recording and calculating XEOL spectra", Proc. SPIE 5773, Saratov Fall Meeting 2004: Laser Physics and Photonics, Spectroscopy, and Molecular Modeling V, (9 June 2005); https://doi.org/10.1117/12.636988
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Cited by 2 scholarly publications.
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KEYWORDS
Luminescence

Crystals

Absorption

Synchrotron radiation

Chemical elements

Electrons

X-rays

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