Paper
8 December 2004 Preparation and characterization of Nd-doped Bi4Ti3O12 thin films by pulsed laser deposition method
Wen Biao Wu, Zhong Yan Meng, A. Shibuya, M. Okuyama
Author Affiliations +
Proceedings Volume 5774, Fifth International Conference on Thin Film Physics and Applications; (2004) https://doi.org/10.1117/12.607285
Event: Fifth International Conference on Thin Film Physics and Applications, 2004, Shanghai, China
Abstract
Perovskite Neodymium-modified Bi4Ti3O12 (BNdT) thin films were prepared on Pt/TiO2/SiO2/Si substrates by the pulsed laser deposition (PLD) technique, and their structures and ferroelectric properties were investigated. The remnant polarization was increased with Nd-modification. The remanent polarization (2Pr) and coercive field (2Ec) of BNdT thin films are 78 μC/cm2 and 619 kV/cm, respectively. The good fatigue behavior of BNdT films has been obtained. The reduction of remanent polarization of +Pr and -Pr is smaller than 25 % after 1010 switching cycles. The effect of substrate temperature and laser repetition frequency on the structure and ferroelectric properties is remarkable.
© (2004) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Wen Biao Wu, Zhong Yan Meng, A. Shibuya, and M. Okuyama "Preparation and characterization of Nd-doped Bi4Ti3O12 thin films by pulsed laser deposition method", Proc. SPIE 5774, Fifth International Conference on Thin Film Physics and Applications, (8 December 2004); https://doi.org/10.1117/12.607285
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KEYWORDS
Thin films

Bismuth

Polarization

Neodymium

Particles

Pulsed laser deposition

Ions

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