Determination of thermal parameters of microbolometers from electrical measurements

I. B. Chistokhin; M. A. Demjanenko

doi:10.1117/12.628888

7 June 2005 Determination of thermal parameters of microbolometers from electrical measurements

I. B. Chistokhin, M. A. Demjanenko

Proceedings Volume 5834, 18th International Conference on Photoelectronics and Night Vision Devices; (2005) https://doi.org/10.1117/12.628888
Event: 18th International Conference on Photoelectronics and Night Vision Devices and Quantum Informatics 2004, 2004, Moscow, Russian Federation

Abstract

The analysis of dynamics of self-heating and electrical signals in pulse biased microbolometers connected in different modes (constant voltage and constant current modes and also Wheatstone bridge) is presented. Analytical expressions for determination of thermal parameters (thermal time constant heat capacitance and thermal conductance) of thermoresistive microbolometers applicable under significant heating are derived. The experimental results are in good agreement with the theoretical analytical dependences.

Citation Download Citation

I. B. Chistokhin and M. A. Demjanenko "Determination of thermal parameters of microbolometers from electrical measurements", Proc. SPIE 5834, 18th International Conference on Photoelectronics and Night Vision Devices, (7 June 2005); https://doi.org/10.1117/12.628888

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available