Experimental comparison of different oscillation-based test techniques in an analog block

Kay Suenaga; Rodrigo Picos; Sebastia Bota; Miquel Roca; Eugeni Garcia-Moreno

doi:10.1117/12.608801

30 June 2005 Experimental comparison of different oscillation-based test techniques in an analog block

Kay Suenaga, Rodrigo Picos, Sebastia Bota, Miquel Roca, Eugeni Garcia-Moreno

Proceedings Volume 5837, VLSI Circuits and Systems II; (2005) https://doi.org/10.1117/12.608801
Event: Microtechnologies for the New Millennium 2005, 2005, Sevilla, Spain

Abstract

This paper experimentally analyses the capabilities of an Oscillation-Based Test technique for diagnosis purposes. To evaluate the feasibility of this test strategy, the technique is applied to an Operational Transconductance Amplifier with fault injection capabilities. The application of this methodology has low impact on circuit performances. Voltage and current magnitude have been considered as test observables. The effects of catastrophic and parametric defects (bridges, opens and shorts) are analyzed in this work. Results show that by a right choice of the test observable, this technique provides high fault coverage levels even in the case of process variations.

Citation Download Citation

Kay Suenaga, Rodrigo Picos, Sebastia Bota, Miquel Roca, and Eugeni Garcia-Moreno "Experimental comparison of different oscillation-based test techniques in an analog block", Proc. SPIE 5837, VLSI Circuits and Systems II, (30 June 2005); https://doi.org/10.1117/12.608801

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