Optoelectronic device for the measurement of the absolute linear position in the micrometric displacement range

Tomas Morlanes; Jose Luis de la Pena; Luis Miguel Sanchez-Brea; Jose Alonso; Daniel Crespo; Jose Bienvenido Saez-Landete; Eusebio Bernabeu

doi:10.1117/12.628135

7 July 2005 Optoelectronic device for the measurement of the absolute linear position in the micrometric displacement range

Tomas Morlanes, Jose Luis de la Pena, Luis Miguel Sanchez-Brea, Jose Alonso, Daniel Crespo, Jose Bienvenido Saez-Landete, Eusebio Bernabeu

Author Affiliations +

Proceedings Volume 5840, Photonic Materials, Devices, and Applications; (2005) https://doi.org/10.1117/12.628135
Event: Microtechnologies for the New Millennium 2005, 2005, Sevilla, Spain

Abstract

In this work, an optoelectronic device that provides the absolute position of a measurement element with respect to a pattern scale upon switch-on is presented. That means that there is not a need to perform any kind of transversal displacement after the startup of the system. The optoelectronic device is based on the process of light propagation passing through a slit. A light source with a definite size guarantees the relation of distances between the different elements that constitute our system and allows getting a particular optical intensity profile that can be measured by an electronic post-processing device providing the absolute location of the system with a resolution of 1 micron. The accuracy of this measuring device is restricted to the same limitations of any incremental position optical encoder.

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Tomas Morlanes, Jose Luis de la Pena, Luis Miguel Sanchez-Brea, Jose Alonso, Daniel Crespo, Jose Bienvenido Saez-Landete, and Eusebio Bernabeu "Optoelectronic device for the measurement of the absolute linear position in the micrometric displacement range", Proc. SPIE 5840, Photonic Materials, Devices, and Applications, (7 July 2005); https://doi.org/10.1117/12.628135

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