Paper
1 June 2005 Atomic and molecular trace analysis by diode laser spectroscopy
J. Koch, A. Zybin, K. Kunze, K. Niemax
Author Affiliations +
Proceedings Volume 5849, Fifth Workshop on Atomic and Molecular Physics; (2005) https://doi.org/10.1117/12.629390
Event: Fifth Workshop on Atomic and Molecular Physics, 2004, Jurata, Poland
Abstract
Diode laser absorption spectroscopy (DLAS) in plasmas, flames and electrothermal atomizers and their combination with separation techniques is presented as a simple highly sensitive and robust method for trace analysis of elements and molecular species. The analytical figures of merit of the technique are demonstrated by the measurement of elements relevant in industrial and environmental samples, as well as molecular species including halogen atoms, hydrogen, carbon and sulfur.
© (2005) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
J. Koch, A. Zybin, K. Kunze, and K. Niemax "Atomic and molecular trace analysis by diode laser spectroscopy", Proc. SPIE 5849, Fifth Workshop on Atomic and Molecular Physics, (1 June 2005); https://doi.org/10.1117/12.629390
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KEYWORDS
Semiconductor lasers

Absorption

Spectroscopy

Sensors

Modulation

Statistical analysis

Chemical elements

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