Iron-silicon interface formation and properties by data of DRS, SMOKE, and AFM measurements

S. A. Dotsenko; N. G. Galkin; A. S. Gouralnik; L. A. Koval; T. V. Turchin

doi:10.1117/12.634545

8 June 2005 Iron-silicon interface formation and properties by data of DRS, SMOKE, and AFM measurements

S. A. Dotsenko, N. G. Galkin, A. S. Gouralnik, L. A. Koval, T. V. Turchin

Proceedings Volume 5851, Fundamental Problems of Optoelectronics and Microelectronics II; (2005) https://doi.org/10.1117/12.634545
Event: Fundamental Problems of Optoelectronics and Microelectronics II, 2004, Khabrovsk, Russian Federation

Abstract

The method of Differential Reflection Spectroscopy (DRS) have been applied to study thin iron films during the process of growth on Si (111) or Si(100) surfaces at room temperature. Some details on the Dynamic Standard method in DRS method are presented. Magnetic properties of as-grown films have been demonstrated by the SMOKE method. Dependence ofdielectric functions of the films on the deposit amount is given.

Citation Download Citation

S. A. Dotsenko, N. G. Galkin, A. S. Gouralnik, L. A. Koval, and T. V. Turchin "Iron-silicon interface formation and properties by data of DRS, SMOKE, and AFM measurements", Proc. SPIE 5851, Fundamental Problems of Optoelectronics and Microelectronics II, (8 June 2005); https://doi.org/10.1117/12.634545

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available