PROCEEDINGS VOLUME 5856
OPTICAL METROLOGY | 13-17 JUNE 2005
Optical Measurement Systems for Industrial Inspection IV
Editor Affiliations +
IN THIS VOLUME

6 Sessions, 119 Papers, 0 Presentations
Applications  (23)
Proceedings Volume 5856 is from: Logo
OPTICAL METROLOGY
13-17 June 2005
Munich, Germany
New Approaches: Algorithms and Sensors
Proceedings Volume Optical Measurement Systems for Industrial Inspection IV, (2005) https://doi.org/10.1117/12.621581
Fereydoun Lakestani, Maurice Patrick Whelan, Julie Garvey, David Newport
Proceedings Volume Optical Measurement Systems for Industrial Inspection IV, (2005) https://doi.org/10.1117/12.612721
Hussein Abdul-Rahman, Munther Gdeisat, David Burton, Michael Lalor
Proceedings Volume Optical Measurement Systems for Industrial Inspection IV, (2005) https://doi.org/10.1117/12.611415
Marco Greve, Bernd Bodermann, Harald R. Telle, Peter Baum, Eberhard Riedle
Proceedings Volume Optical Measurement Systems for Industrial Inspection IV, (2005) https://doi.org/10.1117/12.612555
O. V. Angelsky, A. G. Ushenko, I. M. Vashenko, L. M. Bodnar
Proceedings Volume Optical Measurement Systems for Industrial Inspection IV, (2005) https://doi.org/10.1117/12.612424
Proceedings Volume Optical Measurement Systems for Industrial Inspection IV, (2005) https://doi.org/10.1117/12.612411
Proceedings Volume Optical Measurement Systems for Industrial Inspection IV, (2005) https://doi.org/10.1117/12.612935
Istvan Banyasz, Janos Kornis
Proceedings Volume Optical Measurement Systems for Industrial Inspection IV, (2005) https://doi.org/10.1117/12.612834
Qifeng Yu, Xia Yang, Xiaohu Zhang, Sihua Fu, Xiangyi Sun
Proceedings Volume Optical Measurement Systems for Industrial Inspection IV, (2005) https://doi.org/10.1117/12.612488
Proceedings Volume Optical Measurement Systems for Industrial Inspection IV, (2005) https://doi.org/10.1117/12.612547
Proceedings Volume Optical Measurement Systems for Industrial Inspection IV, (2005) https://doi.org/10.1117/12.612108
Proceedings Volume Optical Measurement Systems for Industrial Inspection IV, (2005) https://doi.org/10.1117/12.613017
Proceedings Volume Optical Measurement Systems for Industrial Inspection IV, (2005) https://doi.org/10.1117/12.612896
Proceedings Volume Optical Measurement Systems for Industrial Inspection IV, (2005) https://doi.org/10.1117/12.612008
Proceedings Volume Optical Measurement Systems for Industrial Inspection IV, (2005) https://doi.org/10.1117/12.612418
K. Postava, P. Hlubina, A. Maziewski, R. Ossikovski, M. Foldyna, O. Zivotsky, J. Pistora, S. Visnovsky, T. Yamaguchi
Proceedings Volume Optical Measurement Systems for Industrial Inspection IV, (2005) https://doi.org/10.1117/12.612489
Proceedings Volume Optical Measurement Systems for Industrial Inspection IV, (2005) https://doi.org/10.1117/12.613252
R. Reichle, C. Pruss, W. Osten, H. J. Tiziani, F. Zimmermann, C. Schulz
Proceedings Volume Optical Measurement Systems for Industrial Inspection IV, (2005) https://doi.org/10.1117/12.612644
Shape Measurement
H. Hofler, C. Baulig, A. Blug, M. Dambacher, N. Dimopoulos, H. Wolfelschneider
Proceedings Volume Optical Measurement Systems for Industrial Inspection IV, (2005) https://doi.org/10.1117/12.621583
Proceedings Volume Optical Measurement Systems for Industrial Inspection IV, (2005) https://doi.org/10.1117/12.612568
Proceedings Volume Optical Measurement Systems for Industrial Inspection IV, (2005) https://doi.org/10.1117/12.611890
Markus Brandner, Thomas Thurner
Proceedings Volume Optical Measurement Systems for Industrial Inspection IV, (2005) https://doi.org/10.1117/12.612616
Proceedings Volume Optical Measurement Systems for Industrial Inspection IV, (2005) https://doi.org/10.1117/12.612537
Proceedings Volume Optical Measurement Systems for Industrial Inspection IV, (2005) https://doi.org/10.1117/12.612471
Proceedings Volume Optical Measurement Systems for Industrial Inspection IV, (2005) https://doi.org/10.1117/12.612433
Gerd Ehret, Bernd Bodermann, Werner Mirande
Proceedings Volume Optical Measurement Systems for Industrial Inspection IV, (2005) https://doi.org/10.1117/12.612460
D. Fontani, F. Francini, D. Jafrancesco, L. Mercatelli, P. Sansoni
Proceedings Volume Optical Measurement Systems for Industrial Inspection IV, (2005) https://doi.org/10.1117/12.612114
Joachim Gerhardt, Ralf Geckeler, Michael Schulz, Clemens Elster
Proceedings Volume Optical Measurement Systems for Industrial Inspection IV, (2005) https://doi.org/10.1117/12.612492
Petra Aswendt, Roland Hofling, Soren Gartner
Proceedings Volume Optical Measurement Systems for Industrial Inspection IV, (2005) https://doi.org/10.1117/12.621587
Proceedings Volume Optical Measurement Systems for Industrial Inspection IV, (2005) https://doi.org/10.1117/12.621582
Proceedings Volume Optical Measurement Systems for Industrial Inspection IV, (2005) https://doi.org/10.1117/12.611825
Proceedings Volume Optical Measurement Systems for Industrial Inspection IV, (2005) https://doi.org/10.1117/12.612249
Proceedings Volume Optical Measurement Systems for Industrial Inspection IV, (2005) https://doi.org/10.1117/12.612076
Proceedings Volume Optical Measurement Systems for Industrial Inspection IV, (2005) https://doi.org/10.1117/12.612087
Stephan Reichelt, Alexander Bieber, Bernd Aatz, Hans Zappe
Proceedings Volume Optical Measurement Systems for Industrial Inspection IV, (2005) https://doi.org/10.1117/12.612584
Proceedings Volume Optical Measurement Systems for Industrial Inspection IV, (2005) https://doi.org/10.1117/12.612600
Proceedings Volume Optical Measurement Systems for Industrial Inspection IV, (2005) https://doi.org/10.1117/12.612442
Masahide Itoh, Shin Uematsu, Hiroshi Ishiwata, Toyohiko Yatagai
Proceedings Volume Optical Measurement Systems for Industrial Inspection IV, (2005) https://doi.org/10.1117/12.612481
Proceedings Volume Optical Measurement Systems for Industrial Inspection IV, (2005) https://doi.org/10.1117/12.612563
Jose M. Enguita, Ignacio Alvarez, Cesar Fraga, Jorge Marina, Yolanda Fernandez, Gabriel Sirat
Proceedings Volume Optical Measurement Systems for Industrial Inspection IV, (2005) https://doi.org/10.1117/12.612259
Proceedings Volume Optical Measurement Systems for Industrial Inspection IV, (2005) https://doi.org/10.1117/12.612545
Proceedings Volume Optical Measurement Systems for Industrial Inspection IV, (2005) https://doi.org/10.1117/12.612577
Holger Wagner, Axel Wiegmann, Richard Kowarschik, Friedrich Zollner
Proceedings Volume Optical Measurement Systems for Industrial Inspection IV, (2005) https://doi.org/10.1117/12.612225
Yu. V. Chugui, Yu. A. Lemeshko
Proceedings Volume Optical Measurement Systems for Industrial Inspection IV, (2005) https://doi.org/10.1117/12.621588
Proceedings Volume Optical Measurement Systems for Industrial Inspection IV, (2005) https://doi.org/10.1117/12.612589
Displacement and Strain Measurement
Richard Burguete, Erwin Hack, Malgorzata Kujawinska, Eann Patterson, Leszek Salbut, Quasim Saleem, Thorsten Siebert, Maurice Whelan
Proceedings Volume Optical Measurement Systems for Industrial Inspection IV, (2005) https://doi.org/10.1117/12.621586
Peter A. A. M. Somers, Nandini Bhattacharya
Proceedings Volume Optical Measurement Systems for Industrial Inspection IV, (2005) https://doi.org/10.1117/12.612562
Holger Joost, Klaus D. Hinsch, Gerd Gulker
Proceedings Volume Optical Measurement Systems for Industrial Inspection IV, (2005) https://doi.org/10.1117/12.612573
Roger M. Groves, Edmon Chehura, Weilai Li, Stephen E. Staines, Stephen W. James, Ralph P. Tatam
Proceedings Volume Optical Measurement Systems for Industrial Inspection IV, (2005) https://doi.org/10.1117/12.611887
Ervin Nippolainen, Dmitry V. Semenov, Alexei A. Kamshilin, Andrey V. Belyaev, Sergei V. Andreev, Boris S. Gurevich
Proceedings Volume Optical Measurement Systems for Industrial Inspection IV, (2005) https://doi.org/10.1117/12.612576
Proceedings Volume Optical Measurement Systems for Industrial Inspection IV, (2005) https://doi.org/10.1117/12.611996
Proceedings Volume Optical Measurement Systems for Industrial Inspection IV, (2005) https://doi.org/10.1117/12.612618
Proceedings Volume Optical Measurement Systems for Industrial Inspection IV, (2005) https://doi.org/10.1117/12.612097
Michal Jozwik, Christophe Gorecki, Andrei Sabac, Dominique Heinis, Thierry Dean, Alain Jacobelli
Proceedings Volume Optical Measurement Systems for Industrial Inspection IV, (2005) https://doi.org/10.1117/12.612605
Proceedings Volume Optical Measurement Systems for Industrial Inspection IV, (2005) https://doi.org/10.1117/12.612581
Proceedings Volume Optical Measurement Systems for Industrial Inspection IV, (2005) https://doi.org/10.1117/12.612414
Non-Destructive Testing
Ricardo Suterio, Armando Albertazzi G. Jr., Felipe Kleber Amaral, Anderson Pacheco
Proceedings Volume Optical Measurement Systems for Industrial Inspection IV, (2005) https://doi.org/10.1117/12.612615
S. Recuero, N. Andres, M. P. Arroyo, F. Lera, L. A. Angurel
Proceedings Volume Optical Measurement Systems for Industrial Inspection IV, (2005) https://doi.org/10.1117/12.612601
Y. Gan, G. Kupfer, W. Steinchen
Proceedings Volume Optical Measurement Systems for Industrial Inspection IV, (2005) https://doi.org/10.1117/12.613113
V. Muzet, E. Lacot, O. Hugon, Y. Guillard
Proceedings Volume Optical Measurement Systems for Industrial Inspection IV, (2005) https://doi.org/10.1117/12.611268
J-L. Dewandel, M. Heraud, S. Rex, M. Mathes, T. Lanen, L. Joannes
Proceedings Volume Optical Measurement Systems for Industrial Inspection IV, (2005) https://doi.org/10.1117/12.612265
Applications
Proceedings Volume Optical Measurement Systems for Industrial Inspection IV, (2005) https://doi.org/10.1117/12.621584
Proceedings Volume Optical Measurement Systems for Industrial Inspection IV, (2005) https://doi.org/10.1117/12.612559
Pascal Vairac, Bernard Cretin, Benjamin Joly
Proceedings Volume Optical Measurement Systems for Industrial Inspection IV, (2005) https://doi.org/10.1117/12.612639
Michael Berndt, Rainer Tutsch
Proceedings Volume Optical Measurement Systems for Industrial Inspection IV, (2005) https://doi.org/10.1117/12.612883
Proceedings Volume Optical Measurement Systems for Industrial Inspection IV, (2005) https://doi.org/10.1117/12.612473
Yves Emery, Etienne Cuche, Francois Marquet, Nicolas Aspert, Pierre Marquet, Jonas Kuhn, Mikhail Botkine, Tristan Colomb, Frederic Montfort, et al.
Proceedings Volume Optical Measurement Systems for Industrial Inspection IV, (2005) https://doi.org/10.1117/12.612670
Proceedings Volume Optical Measurement Systems for Industrial Inspection IV, (2005) https://doi.org/10.1117/12.612531
Francisco Rodriguez, Benito V. Dorrio, Angel F. Doval, Cristina Trillo, Felix Quintero, Marta Miranda, Carlos Lopez, Jose L. Fernandez
Proceedings Volume Optical Measurement Systems for Industrial Inspection IV, (2005) https://doi.org/10.1117/12.612619
Proceedings Volume Optical Measurement Systems for Industrial Inspection IV, (2005) https://doi.org/10.1117/12.612653
Zhi-Cheng Jian, Jiun-You Lin, Po-Jen Hsieh, Der-Chin Su
Proceedings Volume Optical Measurement Systems for Industrial Inspection IV, (2005) https://doi.org/10.1117/12.612480
New Approaches: Algorithms and Sensors
M. Ares, S. Royo, J. Caum, C. Pizarro
Proceedings Volume Optical Measurement Systems for Industrial Inspection IV, (2005) https://doi.org/10.1117/12.612726
Cheng-liang Ge, Guo-bin Fan, Zhi-qiang Liu, Zheng-dong Li, Jian-tao Wu, Zhi-wei Huang, Zheng Liang
Proceedings Volume Optical Measurement Systems for Industrial Inspection IV, (2005) https://doi.org/10.1117/12.607001
Sai Siva Gorthi, Kameswara Rao Lolla
Proceedings Volume Optical Measurement Systems for Industrial Inspection IV, (2005) https://doi.org/10.1117/12.612620
O. V. Angelsky, A. G. Ushenko, I. M. Vashenko, L. M. Bodnar
Proceedings Volume Optical Measurement Systems for Industrial Inspection IV, (2005) https://doi.org/10.1117/12.612425
Qiu Guan, ShengYong Chen, Wanliang Wang, Y. F. Li
Proceedings Volume Optical Measurement Systems for Industrial Inspection IV, (2005) https://doi.org/10.1117/12.612494
Proceedings Volume Optical Measurement Systems for Industrial Inspection IV, (2005) https://doi.org/10.1117/12.612490
Proceedings Volume Optical Measurement Systems for Industrial Inspection IV, (2005) https://doi.org/10.1117/12.612417
Jesus Caum, J. Arasa, Santiago Royo, M. Ares
Proceedings Volume Optical Measurement Systems for Industrial Inspection IV, (2005) https://doi.org/10.1117/12.612835
Proceedings Volume Optical Measurement Systems for Industrial Inspection IV, (2005) https://doi.org/10.1117/12.612887
Janos Kornis, Balazs Gombkoto
Proceedings Volume Optical Measurement Systems for Industrial Inspection IV, (2005) https://doi.org/10.1117/12.618632
Proceedings Volume Optical Measurement Systems for Industrial Inspection IV, (2005) https://doi.org/10.1117/12.612016
Sai Siva Gorthi, Kameswara Rao Lolla
Proceedings Volume Optical Measurement Systems for Industrial Inspection IV, (2005) https://doi.org/10.1117/12.612634
Igor Gurov, Petr Hlubina, Mikhail Taratin, Alexey Zakharov
Proceedings Volume Optical Measurement Systems for Industrial Inspection IV, (2005) https://doi.org/10.1117/12.612713
Leonid F. Vitushkin, Oleg A. Orlov
Proceedings Volume Optical Measurement Systems for Industrial Inspection IV, (2005) https://doi.org/10.1117/12.611883
Proceedings Volume Optical Measurement Systems for Industrial Inspection IV, (2005) https://doi.org/10.1117/12.608161
Shape Measurement
Proceedings Volume Optical Measurement Systems for Industrial Inspection IV, (2005) https://doi.org/10.1117/12.612245
Lars Seifert, Hans J. Tiziani, Wolfgang Osten
Proceedings Volume Optical Measurement Systems for Industrial Inspection IV, (2005) https://doi.org/10.1117/12.612544
Yogesh C. Diwan, Kameswara Rao Lolla
Proceedings Volume Optical Measurement Systems for Industrial Inspection IV, (2005) https://doi.org/10.1117/12.612649
Bingbing Xia, ShengYong Chen, Wanliang Wang, Qiu Guan
Proceedings Volume Optical Measurement Systems for Industrial Inspection IV, (2005) https://doi.org/10.1117/12.612470
Huan Ren, Xiaodong Jiang, Zuxin Huang, Hua Xu, Wei Zhong, Ke Li
Proceedings Volume Optical Measurement Systems for Industrial Inspection IV, (2005) https://doi.org/10.1117/12.611795
Proceedings Volume Optical Measurement Systems for Industrial Inspection IV, (2005) https://doi.org/10.1117/12.612014
Liqun Chai, Qiao Xu, Yingjie Yu, Yang Deng, Jiancheng Xu
Proceedings Volume Optical Measurement Systems for Industrial Inspection IV, (2005) https://doi.org/10.1117/12.611796
Proceedings Volume Optical Measurement Systems for Industrial Inspection IV, (2005) https://doi.org/10.1117/12.612023
Proceedings Volume Optical Measurement Systems for Industrial Inspection IV, (2005) https://doi.org/10.1117/12.612103
Raghu Kokku, Glen Brooksby
Proceedings Volume Optical Measurement Systems for Industrial Inspection IV, (2005) https://doi.org/10.1117/12.612243
Proceedings Volume Optical Measurement Systems for Industrial Inspection IV, (2005) https://doi.org/10.1117/12.612658
Christoph Munkelt, Peter Kuhmstedt, Matthias Heinze, Herbert Suesse, Gunther Notni
Proceedings Volume Optical Measurement Systems for Industrial Inspection IV, (2005) https://doi.org/10.1117/12.612895
Proceedings Volume Optical Measurement Systems for Industrial Inspection IV, (2005) https://doi.org/10.1117/12.618634
Lanqin Liu, Hansheng Peng, Kainan Zhou, Xiaodong Wang, Xiaoming Zeng, Qihua Zhu, Xiaojun Huang, Xiaofeng Wei, Huan Ren
Proceedings Volume Optical Measurement Systems for Industrial Inspection IV, (2005) https://doi.org/10.1117/12.611993
O. V. Angelsky, A. G. Ushenko, I. M. Vashenko, L. M. Bodnar
Proceedings Volume Optical Measurement Systems for Industrial Inspection IV, (2005) https://doi.org/10.1117/12.612501
Displacement and Strain Measurement
B. Serio, J. J. Hunsinger, D. D. Teyssieux, B. Cretin
Proceedings Volume Optical Measurement Systems for Industrial Inspection IV, (2005) https://doi.org/10.1117/12.612546
Non-Destructive Testing
Proceedings Volume Optical Measurement Systems for Industrial Inspection IV, (2005) https://doi.org/10.1117/12.613250
B. Serio, J. J. Hunsinger, F. Conseil, P. Derderian, D. Collard, L. Buchaillot, M. F. Ravat
Proceedings Volume Optical Measurement Systems for Industrial Inspection IV, (2005) https://doi.org/10.1117/12.612261
Jose L. Fernandez, Cristina Trillo, Angel F. Doval, Daniel Cernadas, Carlos Lopez, Benito V. Dorrio, Marta Miranda, Francisco Rodriguez
Proceedings Volume Optical Measurement Systems for Industrial Inspection IV, (2005) https://doi.org/10.1117/12.612315
Applications
Cesar Fraga, Jose M. Enguita, Ignacio Alvarez, Jorge Marina, Nestor Martinez
Proceedings Volume Optical Measurement Systems for Industrial Inspection IV, (2005) https://doi.org/10.1117/12.612258
Proceedings Volume Optical Measurement Systems for Industrial Inspection IV, (2005) https://doi.org/10.1117/12.612745
Proceedings Volume Optical Measurement Systems for Industrial Inspection IV, (2005) https://doi.org/10.1117/12.621589
Proceedings Volume Optical Measurement Systems for Industrial Inspection IV, (2005) https://doi.org/10.1117/12.612731
Gabriel M. Bilmes, Daniel J. O. Orzi, Oscar E. Martinez, Alberto Lencina
Proceedings Volume Optical Measurement Systems for Industrial Inspection IV, (2005) https://doi.org/10.1117/12.612664
Proceedings Volume Optical Measurement Systems for Industrial Inspection IV, (2005) https://doi.org/10.1117/12.612597
Takayuki Sakaguchi, Kensei Ehara
Proceedings Volume Optical Measurement Systems for Industrial Inspection IV, (2005) https://doi.org/10.1117/12.612472
Proceedings Volume Optical Measurement Systems for Industrial Inspection IV, (2005) https://doi.org/10.1117/12.612449
Proceedings Volume Optical Measurement Systems for Industrial Inspection IV, (2005) https://doi.org/10.1117/12.612416
Hana Chmelickova, Hana Lapsanska, Radim Ctvrtlik
Proceedings Volume Optical Measurement Systems for Industrial Inspection IV, (2005) https://doi.org/10.1117/12.612007
Proceedings Volume Optical Measurement Systems for Industrial Inspection IV, (2005) https://doi.org/10.1117/12.612599
Gerald Zauner, Gerald Darilion, Daniel Heim, G. Hendorfer, Thomas Mueller
Proceedings Volume Optical Measurement Systems for Industrial Inspection IV, (2005) https://doi.org/10.1117/12.612525
Zhi-Cheng Jian, Jiun-You Lin, Po-Jen Hsieh, Huei-Wen Chen, Der-Chin Su
Proceedings Volume Optical Measurement Systems for Industrial Inspection IV, (2005) https://doi.org/10.1117/12.612482
Plenary Session
Ludwig Josef Balk, Ronald Marcus Cramer, Ralf Heiderhoff, Jacob C. H. Phang, Oleg Sergeev, Anne-Katrin Tiedemann
Proceedings Volume Optical Measurement Systems for Industrial Inspection IV, (2005) https://doi.org/10.1117/12.621577
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