Mapping of surface refractive-index distribution by reflection SNOM

Ilya P. Radko; Valentyn S. Volkov; Sergey I. Bozhevolnyi; Jes Henningsen; Jens Pedersen

doi:10.1117/12.612554

29 August 2005 Mapping of surface refractive-index distribution by reflection SNOM

Ilya P. Radko, Valentyn S. Volkov, Sergey I. Bozhevolnyi, Jes Henningsen, Jens Pedersen

Proceedings Volume 5858, Nano- and Micro-Metrology; 585807 (2005) https://doi.org/10.1117/12.612554
Event: Optical Metrology, 2005, Munich, Germany

Abstract

Scanning near-field optical microscopy (SNOM) in reflection is employed for high-resolution mapping of surface refractive-index distributions. Two different single-mode optical fibers with step-index profiles are characterized using a reflection SNOM setup, in which cross-polarized detection is employed to increase the contrast in optical images and, thereby, the method sensitivity. The SNOM images exhibit a clear ring-shaped structure associated with the fiber stepindex profile, indicating that surface refractive-index variations being smaller than 10^-2 can be detected. It is found that the quantitative interpretation of SNOM images requires accurate characterization of a fiber tip used, because the detected optical signal is a result of interference between the optical fields reflected by the sample surface and by the fiber tip itself. The possibilities and limitations of this experimental technique are discussed.

Citation Download Citation

Ilya P. Radko, Valentyn S. Volkov, Sergey I. Bozhevolnyi, Jes Henningsen, and Jens Pedersen "Mapping of surface refractive-index distribution by reflection SNOM", Proc. SPIE 5858, Nano- and Micro-Metrology, 585807 (29 August 2005); https://doi.org/10.1117/12.612554

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