Refractometric low coherence interferometry: dispersion interferometry

M. Bagherzadeh; A. F. Fercher; M. Pircher; W. Drexler; C. K. Hitzenberger

doi:10.1117/12.632971

7 October 2005 Refractometric low coherence interferometry: dispersion interferometry

M. Bagherzadeh, A. F. Fercher, M. Pircher, W. Drexler, C. K. Hitzenberger

Proceedings Volume 5861, Optical Coherence Tomography and Coherence Techniques II; 58610D (2005) https://doi.org/10.1117/12.632971
Event: European Conferences on Biomedical Optics 2005, 2005, Munich, Germany

Abstract

Primarily, low-coherence interferometry yields the optical length, i. e. the product of sample length or sample depth data times the complementary sample refractive index. Each quantity, refractive index as well as sample depth can be obtained from the optical length if the complement is known. In a first step presented here, we use sample dispersion data for absolute depth or thickness measurement of dispersive samples. We shall discuss the physical implications and present preliminary results.

Citation Download Citation

M. Bagherzadeh, A. F. Fercher, M. Pircher, W. Drexler, and C. K. Hitzenberger "Refractometric low coherence interferometry: dispersion interferometry", Proc. SPIE 5861, Optical Coherence Tomography and Coherence Techniques II, 58610D (7 October 2005); https://doi.org/10.1117/12.632971

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