Paper
19 August 2005 Double-handed circular Bragg reflection bands in chiral thin films
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Abstract
Titanium dioxide was evaporated onto rotating substrates at highly oblique deposition angles to create thin films exhibiting a nanostructure which resembles a polygonal helix. Abrupt, periodic rotations of the substrate were used to create triangle, square, pentagon, and star-shaped film morphologies. Experimental optical measurements show that polygonal-helix thin-films exhibit double-handed circular Bragg phenomena. Unlike a standard chiral filter, a polygonal-helix thin-film reflects left-handed circularly polarized light at one frequency band and right-handed circularly polarized light at a second frequency band. The relative wavelength-dependence of the reflection bands is controlled by the angular rotation between arms of a polygonal helix. Spectral-hole polarization filters, produced by adding twist and layer defects to a polygonal helix, are also reported. Twist-defects tend to produce a narrow passband within both circular Bragg reflection bands of a polygonal helix, while a spacing layer defect can be used to produce a passband within only one of the reflection bands.
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Andy C. van Popta, Jeremy C. Sit, and Michael J. Brett "Double-handed circular Bragg reflection bands in chiral thin films", Proc. SPIE 5870, Advances in Thin-Film Coatings for Optical Applications II, 587002 (19 August 2005); https://doi.org/10.1117/12.618039
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KEYWORDS
Reflection

Thin films

Transmittance

Optical filters

Birefringence

Refractive index

Scanning electron microscopy

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