Paper
18 August 2005 Vibration measurement of MEMS by digital laser microinterferometer
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Abstract
A digital laser microinterferometer with a capability to measure both static and dynamic properties of MEMS (Micro-Electro-Mechanical Systems) and microstructures has been developed. This system is designed to exploit a static and a dynamic measurements of microstructure such as MEMS with either a smooth or a rough surface. The method is based on digital laser Michelson interferometry and digital speckle pattern speckle interferometry (TV - holography) incorporated with optoelectronic devices including a special illumination system, a long distance microscope (LDM), a CCD camera, a high precise phase shifting unit and a signal generator for vibration measurement. The special illumination system can perform both a continuous (for static measurements) and a stroboscopic (for dynamic measurements) illumination by utilizing a Acoustic-Optic-Modulator (AOM). In this paper, the theory and methodology of the digital laser micro-interferometer with the stroboscopic illumination method are described. The usefulness of the micro-interferometer is demonstrated by examples of static and dynamic measurements for different MEMS.
© (2005) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Sheng Liu, Dan Thomas, Praveen R. Samala, and Lian Xiang Yang "Vibration measurement of MEMS by digital laser microinterferometer", Proc. SPIE 5878, Advanced Characterization Techniques for Optics, Semiconductors, and Nanotechnologies II, 58780C (18 August 2005); https://doi.org/10.1117/12.617592
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Cited by 4 scholarly publications.
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KEYWORDS
Microelectromechanical systems

Bragg cells

Mirrors

Vibrometry

Speckle

Fringe analysis

Control systems

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