Paper
31 August 2005 Light scatter metrology of diamond turned optics
Author Affiliations +
Abstract
Light scatter, a bothersome source of noise in optical system, can also be used as a sensitive indicator of surface features. Diamond turned optics typically have three types of surface features. In addition to the background near isotropic (two dimensional) roughness found on most polished front surface mirrors, there are two sources of one dimensional roughness. One of these is the expected periodic tool mark structure that can create a diffraction pattern. The other is random one dimensional roughness (parallel to the tool marks) that is caused by chip drag and jitter between tool and sample. This paper discusses experimental methods for separating the effects of these three distinct sources of roughness and gives examples of measurements on several samples. Several sources of confusion associated with rms roughness specifications (which are often substituted for scatter specifications) are also discussed.
© (2005) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
John C. Stover "Light scatter metrology of diamond turned optics", Proc. SPIE 5878, Advanced Characterization Techniques for Optics, Semiconductors, and Nanotechnologies II, 58780R (31 August 2005); https://doi.org/10.1117/12.613779
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CITATIONS
Cited by 7 scholarly publications.
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KEYWORDS
Bidirectional reflectance transmission function

Diamond

Spatial frequencies

Surface finishing

Light scattering

Profilometers

Mirrors

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