Specific photometer for large coated optics

Gael Gaborit; Eric Lavastre; Isabelle Lebeaux; Jean-Christophe Poncetta

doi:10.1117/12.613900

31 August 2005 Specific photometer for large coated optics

Gael Gaborit, Eric Lavastre, Isabelle Lebeaux, Jean-Christophe Poncetta

Proceedings Volume 5878, Advanced Characterization Techniques for Optics, Semiconductors, and Nanotechnologies II; 58781A (2005) https://doi.org/10.1117/12.613900
Event: Optics and Photonics 2005, 2005, San Diego, California, United States

Abstract

This paper presents an overview of a photometer developed by CEA to characterize large coated optics (up to 800 x 400 mm²).

Citation Download Citation

Gael Gaborit, Eric Lavastre, Isabelle Lebeaux, and Jean-Christophe Poncetta "Specific photometer for large coated optics", Proc. SPIE 5878, Advanced Characterization Techniques for Optics, Semiconductors, and Nanotechnologies II, 58781A (31 August 2005); https://doi.org/10.1117/12.613900

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