MODIS polarization ray tracing analysis

N. Souaidia; D. Moyer; G. Meister; S. Pellicori; E. Waluschka; K. Voss

doi:10.1117/12.617635

18 August 2005 MODIS polarization ray tracing analysis

N. Souaidia, D. Moyer, G. Meister, S. Pellicori, E. Waluschka, K. Voss

Proceedings Volume 5888, Polarization Science and Remote Sensing II; 58880H (2005) https://doi.org/10.1117/12.617635
Event: Optics and Photonics 2005, 2005, San Diego, California, United States

Abstract

On-orbit optical sensors are the primary data source for the remote sensing community. A rigorous pre-flight characterization and calibration is a key to the success of their mission. Indeed, preliminary calibration and correction factors are determined during this process. As part of this process, prior to the launch of NASA's Moderate Resolution Imaging Spectroradiometer (MODIS) its polarization sensitivity was measured. In this work, our goal was to simulate these measurements using computer ray tracing software. Based on that, we could evaluate the evolution of the different coatings (Mirror, Beam splitters, Anti-reflection and Band pass filters) due to degradation over time. We were able to simulate the measurements and obtained what the theoretical polarization sensitivity should be. The results were compared to the pre-launch measurements and an analysis of the whole MODIS optical system was performed in order to explain these differences. A full description of the MODIS polarization ray tracing procedure along with a discussion on the results and their implications on past, present and future work will be given.

Citation Download Citation

N. Souaidia, D. Moyer, G. Meister, S. Pellicori, E. Waluschka, and K. Voss "MODIS polarization ray tracing analysis", Proc. SPIE 5888, Polarization Science and Remote Sensing II, 58880H (18 August 2005); https://doi.org/10.1117/12.617635

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