High-energy electron testing of CCDs for a Jovian science mission

Heidi N. Becker; James W. Alexander; Tom Elliott

doi:10.1117/12.623690

25 August 2005 High-energy electron testing of CCDs for a Jovian science mission

Heidi N. Becker, James W. Alexander, Tom Elliott

Proceedings Volume 5902, Focal Plane Arrays for Space Telescopes II; 59020Q (2005) https://doi.org/10.1117/12.623690
Event: Optics and Photonics 2005, 2005, San Diego, California, United States

Abstract

We present results of CCD radiation testing for a proposed Jovian mission. Samples of two candidate star tracker CCDs were irradiated with 10-MeV and 50-MeV electrons at Rensselaer Polytechnic Institute's Gaerttner LINAC. Differences in displacement damage effects on CCD parameters and star tracker performance are discussed for these two energies. Dark current, charge transfer efficiency (CTE), hot pixels, and flat-band voltage shifts are examined. Our electron data is compared to proton irradiation data taken by other experimenters. 10-MeV electron-induced transient data are also discussed.

Citation Download Citation

Heidi N. Becker, James W. Alexander, and Tom Elliott "High-energy electron testing of CCDs for a Jovian science mission", Proc. SPIE 5902, Focal Plane Arrays for Space Telescopes II, 59020Q (25 August 2005); https://doi.org/10.1117/12.623690

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