Paper
30 August 2005 Novel organic photo FET using photo-sensitive gate dielectric layer
M. Yoshida, H. Kawai, T. Kawai, S. Uemura, S. Hoshino, T. Kodzasa, T. Kamata
Author Affiliations +
Abstract
We fabricated a novel type photo-FET using poly(N-vinylcarbazole) as a photosensitive gate dielectric. For the photo-FET, photo-illumination to the PVK insulator layer make the field-effect mobility μFET two order of magnitude higher than dark condition. In particular, under blue-light illumination condition the on-off ratio was also a few ten times higher than dark condition. We concluded that the improvement of the transistor properties resulted from effective charge accumulation at the conductive channel by photo illuminations.
© (2005) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
M. Yoshida, H. Kawai, T. Kawai, S. Uemura, S. Hoshino, T. Kodzasa, and T. Kamata "Novel organic photo FET using photo-sensitive gate dielectric layer", Proc. SPIE 5940, Organic Field-Effect Transistors IV, 594003 (30 August 2005); https://doi.org/10.1117/12.614582
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KEYWORDS
Field effect transistors

Dielectrics

Transistors

Ultraviolet radiation

Gold

Electrodes

Capacitance

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