Charge Coupled Devices (CCDS) For X-Ray Spectroscopy Applications

E. G. Chowanietz; D. H. Lumb; A. A. Wells

doi:10.1117/12.966603

14 July 1986 Charge Coupled Devices (CCDS) For X-Ray Spectroscopy Applications

E. G. Chowanietz, D. H. Lumb, A. A. Wells

Proceedings Volume 0597, X-Ray Instrumentation in Astronomy; (1986) https://doi.org/10.1117/12.966603
Event: 1985 International Technical Symposium/Europe, 1985, Cannes, France

Abstract

The X-ray performance of two new types of GEC P8600 CCDs have been measured. One, a conventional thin depletion layer device, possesses very low noise characteristics enabling good X-ray energy resolution to be achieved, but with only modest quantum efficiency (10% at 5.9 keV). The other, a deep depletion device fabricated on high resistivity silicon also possesses the desired low noise performance (8 electrons rms), combined with much improved quantum efficiencies (60% at 5.9 keV). Degradation of energy resolution due to charge spreading effects has also been overcome through use of the deep depletion layer and the new device has a capability for rejection of background charged particles of around 96%. The development is for spectroscopic instrumentation for X-ray astronomy.

Citation Download Citation

E. G. Chowanietz, D. H. Lumb, and A. A. Wells "Charge Coupled Devices (CCDS) For X-Ray Spectroscopy Applications", Proc. SPIE 0597, X-Ray Instrumentation in Astronomy, (14 July 1986); https://doi.org/10.1117/12.966603

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