Paper
14 July 1986 Low Energy X-Ray Transmission Grating Spectrometer For AXAF
A. C. Brinkman, J. J. van Rooijen, J. A. M. Bleeker, J. H. Dijkstra, J. Heise, P. A. J. de Korte, R. Mewe, F. Paerels
Author Affiliations +
Proceedings Volume 0597, X-Ray Instrumentation in Astronomy; (1986) https://doi.org/10.1117/12.966587
Event: 1985 International Technical Symposium/Europe, 1985, Cannes, France
Abstract
The proposed grating spectrometer for the Advanced X-Ray Astrophysics Facility (AXAF) covers the wavelength region between 2 and 140 Å. The wavelength resolution Δλ = 0.05 Å. The effective sensitive area as a function of wavelength is discussed. To illustrate the expected performance of the spectrometer some simulated spectra of a few interesting astrophysical objects are presented.
© (1986) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
A. C. Brinkman, J. J. van Rooijen, J. A. M. Bleeker, J. H. Dijkstra, J. Heise, P. A. J. de Korte, R. Mewe, and F. Paerels "Low Energy X-Ray Transmission Grating Spectrometer For AXAF", Proc. SPIE 0597, X-Ray Instrumentation in Astronomy, (14 July 1986); https://doi.org/10.1117/12.966587
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Cited by 8 scholarly publications.
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KEYWORDS
Sensors

Spectroscopy

X-rays

Absorption

X-ray astronomy

Plasmas

Telescopes

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