Direct comparision of the damage frequency method and binary search technique

Jonathan W. Arenberg

doi:10.1117/12.637602

7 February 2006 Direct comparision of the damage frequency method and binary search technique

Jonathan W. Arenberg

Author Affiliations +

Proceedings Volume 5991, Laser-Induced Damage in Optical Materials: 2005; 599125 (2006) https://doi.org/10.1117/12.637602
Event: Boulder Damage Symposium XXXVII: Annual Symposium on Optical Materials for High Power Lasers, 2005, Boulder, CO, United States

Abstract

This paper presents a direct comparison of the two main techniques for the determination of laser damage threshold. The two techniques are compared directly to understand the intrinsic biases of each test and what is causing these biases. The comparison is done in terms of accuracy and repeatability of the resulting measurements. It will be shown that under the vast majority of cases the damage frequency method underestimates the true value and has poor repeatability and that the binary search method over estimates the threshold, but is far more repeatable.

Citation Download Citation

Jonathan W. Arenberg "Direct comparision of the damage frequency method and binary search technique", Proc. SPIE 5991, Laser-Induced Damage in Optical Materials: 2005, 599125 (7 February 2006); https://doi.org/10.1117/12.637602

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