Analysis of web defects by correlating 1-D Morlet and 2-D Mexican hat wavelet transforms

Jacques Lewalle; D. Steven Keller

doi:10.1117/12.629908

7 November 2005 Analysis of web defects by correlating 1-D Morlet and 2-D Mexican hat wavelet transforms

Jacques Lewalle, D. Steven Keller

Proceedings Volume 6001, Wavelet Applications in Industrial Processing III; 600109 (2005) https://doi.org/10.1117/12.629908
Event: Optics East 2005, 2005, Boston, MA, United States

Abstract

The manufacturing processes for paper and similar non-woven fiber webs can affect end-use properties. In this paper, we document a new wavelet-based method of product diagnostic. The methods combines 1-dimensional Morlet and isotropic 2-dimensional Mexican hat wavelets, with wavelet-based filtering and denoising techniques. Two samples produced in pilot machines by different forming methods are examined for variations in their mass per unit area - the grammage. The grammage maps are decomposed into three layers: one associated with the nearly-periodic grammage streaks at large scale, one associated with flocs or related medium-size structures, and the background which combines pixel-size fluctuations and large-scale stochastic modulations. By correlating the structure and background fluctuations with the streaks local phase, we show that one sample exhibits formation streaks (statistical variations in properties other than mean grammage), which are not found in the other.

Citation Download Citation

Jacques Lewalle and D. Steven Keller "Analysis of web defects by correlating 1-D Morlet and 2-D Mexican hat wavelet transforms", Proc. SPIE 6001, Wavelet Applications in Industrial Processing III, 600109 (7 November 2005); https://doi.org/10.1117/12.629908

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