Paper
9 December 2005 Displacement measurement with a dual-colored sinusoidal phase-modulating interferometer
Author Affiliations +
Proceedings Volume 6024, ICO20: Optical Devices and Instruments; 60240F (2005) https://doi.org/10.1117/12.666819
Event: ICO20:Optical Devices and Instruments, 2005, Changchun, China
Abstract
Interferometric displacement sensor based on a two-wavelength interferometry is proposed and demonstrated. A combination of time-shared two-wavelength laser diode and sinusoidal phase-modulating interferometry enables us to realize accurate and wide-range displacement measurement with a simple optical setup.
© (2005) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Takamasa Suzuki, Toshihiko Sato, and Osami Sasaki "Displacement measurement with a dual-colored sinusoidal phase-modulating interferometer", Proc. SPIE 6024, ICO20: Optical Devices and Instruments, 60240F (9 December 2005); https://doi.org/10.1117/12.666819
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KEYWORDS
Interferometry

Modulation

Interferometers

Phase interferometry

Semiconductor lasers

Mirrors

Sensors

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