Translator Disclaimer
Paper
10 February 2006 Design and optimization of electronic speckle pattern interferometers to evaluate three-dimensional displacements
Author Affiliations +
Proceedings Volume 6046, Fifth Symposium Optics in Industry; 60462I (2006) https://doi.org/10.1117/12.674670
Event: Fifth Symposium Optics in Industry, 2005, Santiago De Queretaro, Mexico
Abstract
When it is carried out to perform a three dimensional evaluation of displacements and strains, it has been proposed some optical systems which uses three illumination beams or the use of three sensors. The different sensitivity vectors components associated to each illumination beam; let us permit to calculate the displacement in each direction by sensitivity matrix. In the present work, simple geometries of interferometers are discussed. It is showed the sensitivity components for each source in the case of optical set-up with three divergent illuminating beams, where we analysed the sources position that makes possible measure the u, v and w components with a maximum weight factor in each direction respecting to set-up total sensitivity. The sources position is one on x-axis, the second on y-axis and the third near to z-axis. From the theoretical predictions is proposed an interferometer which is based on the ESPI technique which has the sources configuration calculated. Experimental results of displacements are presented to an elastic surface when a rotated load is applied in the centre of the target.
© (2006) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Amalia Martínez, Juan Antonio Rayas, and Raúl Cordero "Design and optimization of electronic speckle pattern interferometers to evaluate three-dimensional displacements", Proc. SPIE 6046, Fifth Symposium Optics in Industry, 60462I (10 February 2006); https://doi.org/10.1117/12.674670
PROCEEDINGS
9 PAGES


SHARE
Advertisement
Advertisement
Back to Top