A New Surface Measuring Technique Using Phase Retrieval By Amplitude Interferometry

Bobby L. Ulich; Christopher K. Walker; Constance E. Philips-Walker; Warren B. Davison; John H. Davis; Charles E. Mayer

doi:10.1117/12.976192

12 May 1986 A New Surface Measuring Technique Using Phase Retrieval By Amplitude Interferometry

Bobby L. Ulich, Christopher K. Walker, Constance E. Philips-Walker, Warren B. Davison, John H. Davis, Charles E. Mayer

Proceedings Volume 0608, Optical Alignment III; (1986) https://doi.org/10.1117/12.976192
Event: O-E/LASE'86 Symposium, 1986, Los Angeles, CA, United States

Abstract

A new surface measuring instrument has been developed which is capable of measuring surface errors to the submicron level. RMS noise in measuring the surface error was found to decrease as [integration time]-1/2. The instrument can measure surface errors to within 10 microns in a small test region in only a few seconds of integration. The instrument could therefore be used to align radio telescope panels to high precision in real time.

Citation Download Citation

Bobby L. Ulich, Christopher K. Walker, Constance E. Philips-Walker, Warren B. Davison, John H. Davis, and Charles E. Mayer "A New Surface Measuring Technique Using Phase Retrieval By Amplitude Interferometry", Proc. SPIE 0608, Optical Alignment III, (12 May 1986); https://doi.org/10.1117/12.976192

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