Fast amplitude and delay measurement for characterization of integrated optic devices

M. Thompson; H. Zhu; W. Rivera; M. Solmaz; D. Adams; C. K. Madsen

doi:10.1117/12.645911

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24 February 2006 Fast amplitude and delay measurement for characterization of integrated optic devices

M. Thompson, H. Zhu, W. Rivera, M. Solmaz, D. Adams, C. K. Madsen

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Proceedings Volume 6123, Integrated Optics: Devices, Materials, and Technologies X; 612304 (2006) https://doi.org/10.1117/12.645911
Event: Integrated Optoelectronic Devices 2006, 2006, San Jose, California, United States

Abstract

A fast, non-interferometric measurement technique that allows the frequency-dependent delay and amplitude responses to be measured is presented. For a single amplitude and relative phase measurement at a fixed optical wavelength, the measurement time is on the order of a microsecond. RF modulation up to 2.7 GHz can be accommodated. A modified technique using frequency modulation is described to overcome non-idealities in the phase measurement. Results are presented for a fiber Bragg grating and an acetylene gas cell with swept-wavelength laser tuning at a rate of 40 nm/s.

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M. Thompson, H. Zhu, W. Rivera, M. Solmaz, D. Adams, and C. K. Madsen "Fast amplitude and delay measurement for characterization of integrated optic devices", Proc. SPIE 6123, Integrated Optics: Devices, Materials, and Technologies X, 612304 (24 February 2006); https://doi.org/10.1117/12.645911

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