Sensitive characteristics of cyanine dye J-aggregates in the film of silver chloride microcrystals

Xiaowei Li; Jixian Zhang; Rongxiang Zhang; Xiaohui Zhao; Weidong Lai

doi:10.1117/12.674355

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9 June 2006 Sensitive characteristics of cyanine dye J-aggregates in the film of silver chloride microcrystals

Xiaowei Li, Jixian Zhang, Rongxiang Zhang, Xiaohui Zhao, Weidong Lai

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Proceedings Volume 6149, 2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies; 61493J (2006) https://doi.org/10.1117/12.674355
Event: 2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies, 2005, Xian, China

Abstract

Microwave absorption and dielectric spectrum detection technology, with high time resolution (less than 1ns), was used for non-contact measurement of electron property in solid materials. In this paper, the photoelectron decay time-resolved spectra of free electrons in cubic AgCl emulsion sensitized by different concentrations of green-sensitive cyanine dye were measured by dielectric spectrum equipment. At the same time the absorption spectra were obtained by spectrophotometer. Experiments show that when the sensitive concentration is less than 0.02ml(5.0mg/ml)/40g emulsion, the dye J-aggregate is not formed on the surface of silver chloride microcrystals; The photoelectron decay is slower than that of pure cubic AgCl emulsion. when the sensitive concentration is more than 0.2ml (5.0mg/ml)/40g emulsion, the dye J-aggregate is formed on the surface of silver chloride microcrystals; compared to the M-state of dye, the maximal absorption peak of J-aggregate is shifted to longer wavelength about 50nm. The photoelectron decay is faster than that of pure cubic AgCl emulsion.

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Xiaowei Li, Jixian Zhang, Rongxiang Zhang, Xiaohui Zhao, and Weidong Lai "Sensitive characteristics of cyanine dye J-aggregates in the film of silver chloride microcrystals", Proc. SPIE 6149, 2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies, 61493J (9 June 2006); https://doi.org/10.1117/12.674355

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