Analysis on influence of illumination in MTF measurement within infrared spectral bands

Wei Dong; Renkui Zhou

doi:10.1117/12.677989

19 May 2006 Analysis on influence of illumination in MTF measurement within infrared spectral bands

Wei Dong, Renkui Zhou

Proceedings Volume 6150, 2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment; 61500J (2006) https://doi.org/10.1117/12.677989
Event: 2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies, 2005, Xian, China

Abstract

It had been proved that MTF plays a key role in evaluation the quality of imaging system even in infrared spectral bands. Two methods of MTF test procedures have been used widely in visible domain, i.e. the direct method which is based on measuring the response to sinusoidal; and the indirect method, which is based upon computing the Fourier transform of the measured line spread function. However it can also be used in infrared spectral bands even in the evaluation of the system with staring arrays. But there is still something different in infrared imaging system. The infrared flux will be influenced by many factors such as: optimum focus, not normalized to zero spatial frequency properly, signal out of linear region, blackbody or ambient temperature changes during the test, S/N ratio and the width of the slit on the sensor's surface. Concerning the applications of staring arrays system both MRTD and MTF are the main factors in the target acquisition characteristics in infrared wavebands. So the MTF test could be implemented on fixed special frequency, for example 20lp/mm, We will deal with the influence of illumination on sensor with SRF (slit response function) method under a special frequency.

Citation Download Citation

Wei Dong and Renkui Zhou "Analysis on influence of illumination in MTF measurement within infrared spectral bands", Proc. SPIE 6150, 2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 61500J (19 May 2006); https://doi.org/10.1117/12.677989

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KEYWORDS

Modulation transfer functions

Infrared imaging

Infrared radiation

Sensors

Spatial frequencies

Imaging systems

Image sensors

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