Innovation application of area array CCD based on CPLD

Riming Wang; Du Xu; Yongping Jiang; Zhikai Xie

doi:10.1117/12.676650

23 February 2006 Innovation application of area array CCD based on CPLD

Riming Wang, Du Xu, Yongping Jiang, Zhikai Xie

Proceedings Volume 6150, 2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment; 61504I (2006) https://doi.org/10.1117/12.676650
Event: 2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies, 2005, Xian, China

Abstract

The location of image sensor used to obtain images of online products is fixed in a quality inspection system for print production. For motion print products online, linear scan with linear CCD is selected; for still print products online, array CCD is selected to work in area scan mode. Based on the thoroughly comprehension of the generation principle and the transfer mechanism of signal charge, a new method is proposed after serious research on the characteristic of physical architecture and the driver timing of frame transfer and interline transfer area array CCD. An area array CCD can be used to act as linear CCD or array CCD by changing CCD drive timing, which satisfies the actual demands of quality inspection under motion conditions and still conditions in print production. The change of driver timing for array CCD is realized by using CPLD which has in-system flexible programmability. High quality images of motion or still online print products are obtained by one area array CCD by selecting corresponding driver timing.

Citation Download Citation

Riming Wang, Du Xu, Yongping Jiang, and Zhikai Xie "Innovation application of area array CCD based on CPLD", Proc. SPIE 6150, 2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 61504I (23 February 2006); https://doi.org/10.1117/12.676650

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KEYWORDS

Charge-coupled devices

Clocks

Image quality

Inspection

Electrodes

Image sensors

Quality systems

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