Breakdown field in compression molded silicone dielectric elastomer actuators

Rupak Chakraborty; Sandie Yang; James Biggs

doi:10.1117/12.658762

17 March 2006 Breakdown field in compression molded silicone dielectric elastomer actuators

Rupak Chakraborty, Sandie Yang, James Biggs

Proceedings Volume 6168, Smart Structures and Materials 2006: Electroactive Polymer Actuators and Devices (EAPAD); 616809 (2006) https://doi.org/10.1117/12.658762
Event: SPIE Smart Structures and Materials + Nondestructive Evaluation and Health Monitoring, 2006, San Diego, California, United States

Abstract

We compression molded 50 micron thick silicone films between hot platens (150°C) and room temperature platens (23°C), under high shear flow. After molding and post-curing, a voltage ramp was used to measure dielectric strength in 72 samples, each 1 cm in diameter. Breakdown strengths ranged from 16 to 183 V/μm. Overall, the two methods yielded dielectric films with comparable breakdown strengths.

Citation Download Citation

Rupak Chakraborty, Sandie Yang, and James Biggs "Breakdown field in compression molded silicone dielectric elastomer actuators", Proc. SPIE 6168, Smart Structures and Materials 2006: Electroactive Polymer Actuators and Devices (EAPAD), 616809 (17 March 2006); https://doi.org/10.1117/12.658762

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