Finite element analysis of tip-enhanced Raman scattering

Andrew Downes; Donald Salter; Alistair Elfick

doi:10.1117/12.664039

20 April 2006 Finite element analysis of tip-enhanced Raman scattering

Andrew Downes, Donald Salter, Alistair Elfick

Proceedings Volume 6195, Nanophotonics; 61950D (2006) https://doi.org/10.1117/12.664039
Event: SPIE Photonics Europe, 2006, Strasbourg, France

Abstract

We have performed Finite Element Electromagnetic modeling of light scattering in 'apertureless' Scanning Probe Optical Microscopy. Metal tips above metallic and transparent surfaces were modeled to determine suitable conditions for Tip-Enhanced Raman Spectroscopy (TERS) and fluorescence. Gold, silicon, and oxidized silicon were evaluated as potential tip materials, as were the widely used flat substrates of gold, mica and silicon. The lateral resolution of optical imaging is calculated, as a function of tip-substrate separation. This resolution can be made significantly smaller than the tip radius for small tip-substrate separations. In order to model biologically relevant samples, aqueous environments are investigated for the first time, yielding some surprising results.

Citation Download Citation

Andrew Downes, Donald Salter, and Alistair Elfick "Finite element analysis of tip-enhanced Raman scattering", Proc. SPIE 6195, Nanophotonics, 61950D (20 April 2006); https://doi.org/10.1117/12.664039

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